Research

Publications

Publications in Scientific Journals (or equivalent major conferences with high selectivity level of 17-19% acceptance)

  1. 1.       J. Barajas, R. Akella, M. Holtan,  A. Flores, Experimental Designs andEstimation for Online Display Advertising Attribution in Marketplaces, Marketing Science: Special Issue on Big Data, November, 2016(Accepted for publication).
    2.       K. Caballero-Barajas, R. Akella,  Prediction of Physiological Subsystem Failure and its Impact in the prediction of Patient Mortality, 2015 IEEE International Conference on Big Data (Big Data)(Short paper), pp. 2025-1030 November 29_December 1, 2015, Santa Clara.
    3.       K. Caballero-Barajas, R. Akella, Dynamic Estimation of the Probability of Patient Readmission to the ICU using Electronic Medical Records, AMIA 2015 Annual Symposium, November 14-18, 2015,  San Francisco.(Best Student Paper AMIA/KDD, 1st Prize Award).
    4.       C. Wang, R. Akella, Concept-Based Relevance Models for Medical Information Retrieval, CIKM 2015 (4th ACM International Conference on Information and Knowledge Management), October 19-23, 2015, Melbourne, Australia. 
    5.       K. Caballero-Barajas, R. Akella, Dynamically Modeling Patient’s Health State from Electronic Medical Records: A Time Series Approach, KDD 2015 ( 21st ACM SIGKDD Conference on Knowledge Discovery and Data Mining), August 10-14, 2015, Sydney, Australia.
    1. J. Barajas, R. Akella, M. Holtan, Evaluating User Targeting Policies: Simulation Based on Randomized Experiment Data,  WWW 2015 (World Wide Web 2015) Companion Volume  pp. 11-12 (Short Poster paper), Florence, Italy, May 18-22,2015.
    2. J. Barajas, R. Akella, M. Holtan, J. Kwon, A. Flores, V. Andrei , Dynamic Effects of Ad Impressions on Commercial Actions in Display Advertising, CIKM  ACM Conference (Proceedings of the21 st ACM Conference on Information and Knowledge Management) 2012, pp. 1747-1751, October 29- November 2, 2012, Maui, Hawaii.
    7.       J. Barajas, R. Akella, M. Holtan,  A. Flores, Online Display Advertising Causal Attribution on the Clicker using Randomized Experiments and Potential Outcomes, SDM 2015 (SIAM Internation al Conference on Data Mining),  April 30-May 2, 2015, Vacouver, Canada.
    8.       C. Wang, R. Akella, A Hybrid Approach to Extracting Disorder Mentions from Clinical Notes, AMIA 2015 Joint Summits on Translational Science, pp. 183-187,San Francisco, March 23-27, 2015. 
    9.       K. Caballero, R. Akella, Incorporating Statistical Topic Models in the Retrieval of Healthcare Documents, AMIA 2015 Joint Summits on Translational Science, pp. 430-434, San Francisco, March 23-27, 2015. 
    10.   J. Barajas, R. Akella, M. Holtan, J. Kwon, A. Flores, V. Andrei , Dynamic Evaluation of Online Display Advertising with  Randomized Experiments: An Aggregated Approach, WWW 2013, 22 International World Wide Web Conference, pp. 115-116 (Short poster paper), May 15-17, 2013, Rio de Janeiro.
    11.   S. Shivaji, E.J. Whitehead, R. Akella, S. Kim, “Reducing Features to Improve Classification-Based 
         Bug Prediction, IEEE Transactions on Software Engineering, Vol 39, Issue 4, pp. 552-569,April  2013
     
    13.   K. Caballero, J. Barajas, R. Akella,  The Generalized Dirichlet Distribution in Enhanced Topic Detection, CIKM  ACM Conference (Proceedings of the21 st ACM Conference on Information and Knowledge Management) 2012, pp. 783-792, October 29- November 2,2012, Maui Hawaii. 
    14.   K. Caballero,  R. Akella,Incorporating Statistical Topic Information in Relevance Feedback,
    SIGIR (ACM Special Interest Group on Information Retrieval Conference) 2012, August 12-16, 2012,  Portland, OR (Short paper)
    15.   J. Barajas, R. Akella, M. Holtan, J. Kwon, A. Flores, V. Andrei, Impact of Ad Impressions on Dynamic Commercial Actions: Value Attribution in Marketing, WWW2012 (Proceedings of the 20th International World Wide Web Conference) 2012, April 16-20, 2012, Lyon, France (Shor  paper)
  2. J. Barajas, R. Akella, M. Holtan, J. Kwon, B. Null, Measuring the Effectiveness of Display Advertising: A Time Series Approach, WWW2011 (Proceedings of the 20th International World Wide Web Conference) 2011, pp. March 28-April 1, 2011, Hyderabad, India.
  3. C. Wang, R. Akella, S. Ramachandran, Knowledge Extraction and Reuse within “Smart” Service Centers, SRII (Proceedings of the 1st Global SRII Conference of the Services Research and Innovation Institute) 2011, pp., March 29-April 2, 2011, San Jose, CA. Awarded Best Paper Overall.
  4. C. Wang, R. Akella, S. Ramachandran, Hierarchical Service Analytics for Improving Productivity in an Enterprise Service Center, CIKM (Proceedings of the 19th ACM Conference on Information and Knowledge Management) 2010, pp., October 25-29,2010, Toronto, Canada.
  5. Z.  Xu, R. Akella, Improving Probabilistic Information Retrieval by Modeling Burstiness of Words, Information Processing and Management, Vol. 46, No. 2,  pp. 143-158, March 2010.
  6. S. Shivaji, E. J. Whitehead, Jr., R. Akella, S. Kim, Reducing Features to Improve Bug Prediction, International Conference on Automated Software Engineering (ASE), 2009, Auckland, New Zealand, Nov. 16-20, 2009.
  7. R. Akella, Z. Xu, J. Barjas, K. Caballero, Knowledge Sciences in Services Automation: Integration Models and Perspectives for Service Centers, (Invited Paper), IEEE Conference on Automation Science and Engineering (CASE), 2009, pp. 71-88, August 22-25, Bangalore, 2009.
  8.  Z. Xu, R. Akella, Active Relevance Feedback for Difficult Queries, CIKM (Proceedings of the 17th ACM Conference on Information and Knowledge Management) 2008, pp. 459-468, 2008, October 26-30, 2008, Napa Valley, California.
  9. Z. Xu, R. Akella, A Bayesian Logistic Regression Model for Active Relevance Feedback, SIGIR (ACM Special Interest Group on Information Retrieval Conference) 2008, July 20-24, July 2008, Singapore.
  10. Z. Xu, R. Akella, A New Probabilistic Retrieval Model Based on the Dirichlet Compound Multinomial Distribution, SIGIR (ACM Special Interest Group on Information Retrieval Conference) 2008, July 20-24, 2008, Singapore.
  11. Z. Xu, R. Akella, M. Ching, R. Tang, Semi-supervised Clustering Using Bayesian Regularization, High Performance Data Mining Workshop, ICDM, IEEE International Conference on Data Mining Proceedings, 2007, pp. 361-366, October 28-31, 2007, Omaha, Nebraska.
  12. Z. Xu, R. Akella, Y. Zhang, Incorporating Diversity and Density in Active Learning for Relevance Feedback, 29th European Conference on Information Retrieval (ECIR), Proceedings, Rome, Italy, pp. 246-257, April 2-5, 2007, Rome.
  13. B. Roussev, and R. Akella, “Agile Outsourcing Projects: Structure and Management”,  International Journal of e-Collaboration: Special issue on Collaborative Project Management,  Vol. 2, Issue 4, pp. 37-52, March/June 2006.
  14. A. N. Srivastava ,R. Akella, V. Diev, S. P. Kumaresan, D. M. McIntosh, M. Pontikakis, Z. Xu, and Y. Zhang, “Enabling the Discovery of Recurring Anomalies in Aerospace System Problem Reports using High-Dimensional Clustering Techniques”, IEEE Aerospace Conference Proceedings, Big Sky, Montana, March 4-11, 2006.
  15. S. Budalakoti, A. Srivastava, R. Akella, “Discovery of Switch Sequence Anomalies in Flights: Aviation Security Analysis using String Matching”, Proceedings of IEEE Aerospace Conference, Big Sky, Montana, March 4-11, 2006.
  16. E. Wang, W. Jang, R. Akella, “ Economic In-line Inspection Sampling Strategy with Learning Effects,” International Journal of Production Research, Vol. 38, No. 18, pp. 4811-4821, December 2000.
  17. H. Gurnani, R. Akella, J.P. Lehoczky, "Supply Management in Assembly Systems with Random Yield and Random Demand,” IIE Transactions, Vol. 32, no. 8, 701-714, August, 2000.
  18. Y. Bassok, R. Anupindi, R. Akella, "Optimal Ordering and Allocation Policies for the N-Product Inventory Problem with Substitutability," Operations Research, Vol. 47, No. 4, pp. 632-642, July-August 1999.
  19. W. Shindo, E. Wang, R. Akella, A.J. Strojwas, " Effective Excursion Detection and Defect Source Identification Through In-line Defect Inspection and Classification," IEEE Transactions on Semiconductor Manufacturing, Vol.12, pp. 3-10, February 1999.
  20. R. Nurani, A.J. Strojwas, W. Maly, C. Ouyang, W. Shindo, R. Akella, M. McIntrye, J. Derrett, In-line Yield Prediction Methodologies Using Patterned Wafer Inspection Information, Special Issue of IEEE Transactions on Semiconductor Manufacturing, Vol. 11, no. 1, 40-47, February 1998.
  21. S. Bollapragada, R. Akella, and R. Srinivasan, “Centralized Ordering and Allocating Policies in a Two-Echelon System with Non-Identical Warehouses,” European Journal of Operational Research, Vol. 106, pp. 74-81, April 1998.
  22. R. Nurani, R. Akella, A.J.S. Strojwas, In-line Defect Sampling Methodology in Yield Management: An Integrated Framework, IEEE Transactions on Semiconductor Manufacturing,Vol. 9, No. 4, 506-517, November 1996.
  23. H. Gurnani, R. Akella, J.P. Lehoczky, "Supply Management in Assembly Systems - Discrete Yield Model," IIE Transactions, Vol. 28, No. 11, pp. 865-878, November 1996.
  24. H. Gurnani, Z. Drezner,R. Akella, Capacity Planning under Different Inspection Strategies, European Journal of Operations Research, Vol. 89, no. 2, 302-312, March 1996.
  25. R. Nurani, R. Akella, A.J. Strojwas, R. Wallace, M. McIntyre, J. Shields, and I. Emami, "Optimal Wafer Inspection Sampling Strategy," Microcontamination Journal, pp. 32-37, February 1995.
  26. F. Ciarallo, R. Akella, and T.E. Morton, "A Periodic Review Model with Uncertain Supply," Management Science, Vol. 40, No. 3, pp. 320-332, March 1994.
  27. R. Anupindi and R. Akella, "Diversification under Supply Uncertainty," Management Science, Vol. 39, No. 8, pp. 944-963, August 1993.
  28. S. Grotzinger, R. Srinivasan, R. Akella, and S. Bollapragada, "Component Procurement and Allocation for Products Assembled to Forecast: Risk Pooling Effects," IBM Journal of Research, Vol. 37 No. 4, pp. 523-536, July 1993.
  29. P. Nandakumar, S.M. Datar, R. Akella, "Models for Measuring and Accounting for Cost of Conformance Quality," Management Science, Vol. 39, No. 1, pp. 1-16, January 1993.
  30. R. Akella, M. Singh, and S. Rajagopalan, "Part Dispatch in Random Yield Multi-stage Flexible Test Systems for Printed Circuit Boards," Operations Research, Vol. 40, No. 4, pp. 776-789, July-August 1992.
  31. S. Bollapragada and R. Akella, "Optimal Inventory policy for Multiplant and Line Coordination in the Presence of Components Comonality and Flexibility" IMACS Transactions (International Association for Mathematics and Computers in Simulations), pp. 331-338, June 1992.
  32. H. Gurnani, R. Anupindi, and R. Akella "Control of a Batch Processing Systems in Semiconductor Wafer Fabrication Facilities," IEEE Transactions on Semiconductor Manufacturing, Vol. 5, No. 4, pp. 319-328,November, 1992.
  33. Y. Bassok, R. Akella, "Ordering and Production Decisions with Supply Quality and Demand Uncertainty," Management Science, Vol. 37, No. 12, pp. 1556-1574, December 1991.
  34. R. Akella, M. Singh, and B. Krogh, "Hierarchical Control Structure for Multi-cell Flexible Assembly Systems," IEEE Journal on Robotics and Automation, Vol. 6, No. 6, pp. 659-672, December 1990.
  35. R. Akella, O. Maimon, and S. B. Gershwin, "Value Function Approximation via Linear Programming for FMS Scheduling," International Journal of Production Research, Vol. 28, No. 8, pp. 1459-1470, August 1990.
  36. M. Singh, C. Abraham, and R. Akella, "A Wafer Design Problem in Semiconductor Manufacturing for Reliable Customer Service," IEEE Transactions on Components, Hybrids, and Manufacturing Technology, Vol. 13, No.1, pp. 103-108, March 1990.
  37. R. Akella and P. R. Kumar, "Optimal Control of Production Rate in a Failure Prone Manufacturing System," IEEE Transactions on Automatic Control, Vol. AC-31, No. 2, pp. 116-126, February 1986.
  38. B. Gershwin, R. Akella and Y. Choong, "Short-term Production Scheduling of an Automated Manufacturing Facility," IBM Journal of Research and Development, Vol. 29, No. 4, pp. 392-400, July 1985.
  39. R. Akella, Y. Choong, and S.B. Gershwin, “Performance of a Hierarchical Production Scheduling Policy,” IEEE Transactions on Components, Hybrids, and
  40. Manufacturing Technology, Special Issue on Flexible Manufacturing, Vol.
  41. CHMT-7, No. 3, pp. 225-240, September 1984. Modified versions appeared by invitation in Robotics and Computer Integrated Manufacturing, Vol. 1, No. 3/4, pp. 299-305, 1984, and in the Annals of Operations Research, Vol. 3, pp. 403-425, 1985.
  42. N. Viswanadham and A. Ramakrishna "Decentralized Estimation and Control in Large-scale Interconnected Systems," Large Scale Systems, Vol. 3, pp. 255-266, November 1982. (Prior to 1983, my name was written as A. Ramakrishna, instead of R. Akella).
  43. A Ramakrishna and N. Viswanadham, "Decentralized Control of Interconnected Dynamical Systems," IEEE Transactions on Automatic Control, Vol. AC-27, No. 1, pp. 159-164, February 1982.
  44. N. Viswanadham and A. Ramakrishna, "Decentralized Regulation of Large Dynamic Systems with Engineering Applications," Large Scale Systems, Vol. 2, No. 3, pp. 191-204, August 1981.
  45. P. Kudva, N. Viswanadham, and A. Ramakrishna, "Observers for Linear Systems with Unknown Inputs," IEEE Transactions on Automatic Control, Vol. AC-25, No. 1, pp. 112-115, February 1980.

 


Conference Proceedings

  1. R. Akella, “ A Novel Integrated Approach to Yield Learning and Management”, ISMA 2000, Singapore, 2000.
  2. J. Kleinknecht, R. Akella, M. Goetzke, B. Kim, L. Woodward, "Further  Business Models for Standard and ASIC Products in the Semiconductor Industry - Competing on Cost and Time-to-Market", International Symposium on Semiconductor Manufacturing (ISSM 1998) Proceedings, pp. 23 - 26, Tokyo, October 1998.
  3. R. Akella, C. Lin, P. Chitturi, "Sampling Methodology for SEM-based Defect Classification: Risk, Cost and Benefit Analysis", International Symposium on Semiconductor Manufacturing (ISSM 1998) Proceedings, pp. 339 - 342, Tokyo, October 1998.
  4. K. Fridgeirsdottir, R. Akella, "Statistical Methodology for Yield Enhancement through Baseline Reduction: Part II, Optimal Sequencing", International Symposium on Semiconductor Manufacturing (ISSM 1998) Proceedings, pp. 269 - 272, Tokyo, October 1998.
  5. R. Akella, J. Kleinknecht, J. Gillespie, B. Kim, A. Frederick, "New Business Models for Standard and ASIC Products in the Semiconductor Industry - Competing on Cost and Time-to-Market", Advanced Semiconductor Manufacturing Conference Proceedings, pp. 190 - 196, Boston, September 1998.
  6. R. Akella, C. Lin, P. Chitturi, "Sampling Methodology for SEM-based Defect Classification: Risk, Cost and Benefit Analysis", Advanced Semiconductor Manufacturing Conference (ASMC) Proceedings, pp. 109 - 114, Boston, September 1998.
  7. K. Fridgeirsdottir, R. Akella, M. Li, P. McNally, S. Mittal, "Statistical Methodology for Yield Enhancement via Baseline Reduction," Advanced Semiconductor Manufacturing Conference (ASMC) Proceedings, pp. 77 - 81, Boston, September 1998.
  8. Kyle Chen, R. Akella, I. Emami, M. McIntyre, " Inspection Sampling and Capacity Allocation in Multi-stage Semiconductor Manufacturing," ISSM (International Symposium on Semiconductor Manufacturing) 1997 Proceedings, San Francisco, pp. 73-75, October 1997.
  9. W. Kuo, R. Akella, and D. Fletcher, "Adaptive Sampling for effective Multi-layer Defect Monitoring," ISSM (International Symposium on Semiconductor Manufacturing) 1997 Proceedings, pp. 289-293, San Francisco, October 1997.
  10. E. Wang, M. Holtan, R. Akella, I. Emami, M. McIntyre, D. Jensen, D. Fletcher, "Valuation of Yield Management Investments," ASMC (American Semiconductor Manufacturing Conference), pp. 1-7, Boston, September, 1997.
  11. W. Kuo, R. Akella, and D. Fletcher, "Effective In-line Defect Monitoring with Variable Wafer Area Coverage," ASMC (American Semiconductor Manufacturing Conference), pp. 289-293, Boston, September, 1997.
  12. W. Shindo, E. Wang, R. Akella, A.J. Strojwas, "Effective Excursion Detection and Defect Source Isolation with Defect Inspection and Classification,"ASMC (American Semiconductor Manufacturing Conference), pp. 146-149, Boston, September, 1997.
  13. W. Shindo, E. Wang, R. Akella, A.J. Strojwas, "Process excursion Detection and Defect Source Identification by Effective Defect Classification," International Workshop on Statistical Metrology,  pp. 90-93, Japan, June, 1997.
  14. R. Nurani, A.J. Strojwas, W. Maly, C. Ouyang, W.Shindo, R. Akella, M. McIntyre, J. Derrett, " In-line Yield Prediction Methodologies Using Patterned Wafer Inspection Information," ISSM (International Symposium on Semiconductor Manufacturing) 1996 Proceedings, pp. 243-248, Tokyo, October 1996.
  15. E.H. Wang, R. Akella, and D. Fletcher, "Optimal Wafer Inspection with Learning Effects," ISSM (International Symposium on Semiconductor Manufacturing) 1996 Proceedings, pp. 239-242, Tokyo, October 1996.
  16. W. Kuo, A.H. Wang, R. Akella, and R.Nurani, "A Combined Adaptive Sampling Strategy with Limited Inspection Capacity," ISSM (International Symposium on Semiconductor Manufacturing) 1996 Proceedings, pp. 235-238,Tokyo, October 1996.
  17. M.McIntyre, R.N. Nurani, R. Akella, "Key Considerations in the Development of Defect Sampling Strategies," American Semiconductor Manufacturing Conference (ASMC) 1996,  pp. 81-85, Tokyo, October 1996.
  18. R. Nurani, R.Akella, and A.J. Strojwas, "Optimal Wafer Inspection Strategy," International Workshop on Statistical Metrology, Honolulu, pp. 83-98, June 1996.
  19. R. Nurani, R. Akella, A.J. Strojwas, R. Wallace, "Role of In-Line Defect Sampling Methodology in Yield Management", ISSM (International Symposium on Semiconductor Manufacturing) 1995 Proceedings, pp. 243-247, Austin, September 1995.
  20. E. Wang, R. Akella, " Resource Allocation for Yield Learning in Semiconductor Manufacturing," American Semiconductor  Manufacturing Conference (ASMC) 1995pp. 260-266, Boston, September  1995.
  21. R. Nurani, R. Akella, and A.J. Strojwas, "Optimal Sampling Plan for In-line Defect Detection," Statistical Metrology Workshop, Austin, TX, pp. 243-247, Austin, August 1995.
  22. R. Nurani, R. Akella, A.J. Strojwas, R. Wallace, M.G. McIntyre, J. Shields, and I. Emami, " Development of An Optimal Sampling Strategy for Wafer Inspection," Proceedings of Microcontamination 94 Conference and Exposition, San Jose, CA, pp. 435-439, October 1994.
  23. R. Nurani, R. Akella, A. J. Strojwas, " Optical Wafer Inspection Strategy For 0.35 um Technology" International Workshop of Statistical Metrology, Honolulu, pp. 83-98, June 1994.
  24. R. Nurani, R. Akella, A.J. Strojwas, R. Wallace, M.G. McIntyre, J. Shields, and I. Emami, “Development of an Optimal Sampling  Strategy for Wafer Inspection," ISSM (International  Symposium on Semiconductor Manufacturing) 1994, pp. 435-439, Tokyo, June 1994.
  25. R. Nurani, R. Akella, and J. G. Shanthikumar "Myopic and feedback based ordering policies for Systems with Forecast Updates." TECHMAN Conference Proceedings, Carnegie Mellon University, Pittsburgh, pp. 159-166, June 1994.
  26. R. Akella and S. Bollapragada, "Enterprise Management: Integration Between Chained MRP Systems," Proceedings of the 1992 Japan-USA Symposium on Flexible Automation, San Francisco, California, pp. 481-485, July 1992.
  27. R. Nurani and R. Akella, "Quality and Speed Trade-offs in Manufacturing Systems," Proceedings of the 1992 IEEE International Conference on Robotics and Automation, pp. 1145-1149, Nice, France, May 1992.
  28. S. Bollapragada and R. Akella, "Optimal Inventory Policy for Multiplant and Line Coordination in the Presence of Components Commonality and Flexibility," published in the Proceedings of the IMACS International Symposium on Modelling and Control of Technological Systems, pp. 331-338, Dublin, May 1991.
  29. H. Gurnani, R. Anupindi, R. Akella, "Control of Batch Processing Systems," Proc. of the 1990 International Conference on Robotics and Automation, Sacramento, California, pp. 1772-1777, April 1991.
  30. R. Akella and H. Gurnani, "Issues in Capacity Planning Under Different Repair Strategies," Proc. of 1990 Japan-U.S.A. Symposium on Flexible Automation, pp. 865-878, Kyoto, Japan, July 1990.
  31. R. Akella, R. Anupindi, "Diversification Under Supply Uncertainty," Proc. of MSET-21, The International Conference on Manufacturing Systems and Environment-Looking Toward the 21st Century, pp. 292-304, Tokyo, Japan, May 1990.
  32. R. Akella, M. Fox, and S. Smith, “Center for Integrated Manufacturing Decision Systems: An Overview,” Proc. of IEEE/CHMT European Electronic Manufacturing Technology Symposium, pp. 169-173, 1989.
  33. R. Akella, "Effect of Uncertainties and Material Flow Constraints in Manufacturing Systems Control," Invited paper in Proc. of International Federation of Automatic Control (IFAC) Conference, Genova, Italy, pp. 174-182, September 1989.
  34. R. Akella with C. Abraham and M. Singh, "Planning for Production of a Set of Components When Yield is Random," Proceedings of Fifth International Electronic Manufacturing Technology (IEEE) Conference, pp. 196-200, Buena Vista, Florida, October 1988.
  35. R. Akella and Y. Bassok, "Combined Component Ordering and Production Decisions in Flexible Assembly Systems," Proc. IEEE Conference on Decision and Control, Austin, Texas, pp. 295-301, December 1988. Expanded version of R. Akella and Y. Bassok, "Combined Component-ordering and Production Planning," Proc. of Workshop on Information in Manufacturing Automation, Dresden, GDR, July 1987.
  36. R. Akella, "Real Time Dispatch, Short Term and Aggregate Planning in CIM," Proc. INDO-US Workshop on Systems and Signal Processing, January 1988.
  37. R. Akella and B. Krogh, "Hierarchical Control Structures for Multi-cell Flexible Assembly System Coordination," Proc. IEEE Conference on Robotics and Automation, pp. 295-301, 1987, Raleigh, North Carolina.
  38. R. Akella, S. Rajagopalan, and P. Kumar, "Part Dispatch in Multi-stage Cardlines," Proc. IEEE Conference on Robotics and Automation, pp. 143-146, San Francisco, California, April 1986.
  39. R. Akella, Y. Choong, and S. B. Gershwin, "Performance of a Hierarchical Production Scheduling Policy," First Special Interest TIMS/ORSA Conference on Flexible Manufacturing Systems, pp. 385-396, Ann Arbor, Michigan, August 1984.
  40. S. B. Gershwin, R. Akella, and Y. Choong, "Short-term Production Scheduling of an Automated Manufacturing Facility," First International Conference on Manufacturing Science and Technology of the Future, Cambridge, pp. 159-164, October 1984; modified version in 23rd IEEE Conference on Decision and Control, Las Vegas, Nevada, December 1984.
  41. N. Viswanadham and A. Ramakrishna, "Observers for Interconnected Systems," Proc. of the IFAC Symposium on Theory and Applications of Digital Control, New Delhi, India, 1982.
  42. A. Ramakrishna and N. Viswanadham, "Decentralized Dynamic Compensators for Large Systems," Proc. of the 20th IEEE Conference on Decision and Control,  pp. 676-684, New Mexico, 1981.
  43. A. Ramakrishna and N. Viswanadham, "Decentralized Control of Interconnected Dynamical Systems," IEEE Conference on Decision and Control, 1980.
  44. N. Viswanadham and A. Ramakrishna, "Decentralized Stabilization of Dynamically Interconnected Systems," Third International Symposium on Large Engineering Systems, Newfoundland, Canada, pp. 868-871, 1980.
  45. A. Ramakrishna and N. Viswanadham, "Application of Decentralized Control Theory in Power System Control," Proc. of IFAC Symposium on Computer Applications in Large-scale Power Systems, Vol. 11, pp. 144-151, New Delhi, India, 1979.
  46. N. Viswanadham, P. Sen, and A. Ramakrishna, "Control of Linear Systems Through Specific Input Channels: A Frequency Domain Approach," Conf. Record, 12th Asilomar Conference on Circuits, Systems, and Computers, pp. 422-426, California, 1978.
  47. A. Ramakrishna and N. Viswanadham, "Decentralized Control of Coupled Linear Systems with Delayed Information Structures," Second International Symposium of Large Engineering Systems, pp. 475-479, Waterloo, Canada, May 1978.

 
Invited Research Publications, including Book Chapters (Sections or Chapters in Edited Monographs, or Similar Volumes)

  1. R. Akella, V. Araman, and J. Kleinknecht, “B2B Markets: Procurement and Supplier Risk Management in E-Business,” Supply Chain Management Models, Applications, and Research Directions, J. Geunes, P.M. Pardalos, and H.E. Romeijn, (editors). Kluwer Acadmic Publishers, pp. 33-68, 2001
  2. R. Nurani, R. Akella, A.J. Strojwas, R. Wallace, M.G. McIntyre, J. Shields, and I. Emami,   "Development of An Optimal Sampling Strategy for Wafer Inspection," Semiconductor FABTECH, Global Development and Developments in Semiconductor Manufacturing," Issue 1, pp. 229-233, April 1994.
  3. R. Akella, "Real Time Part Dispatch in Flexible Assembly and Test Systems," Operations Research Models in Flexible Manufacturing Systems, Springer-Verlag Wien-New York, Eds. F. Archetti, M. Lucertini, and P. Serafini, pp. 1-73, 1989.
  4. R. Akella, Y. Choong, and S. B. Gershwin, "Performance of a Hierarchical Production Scheduling Policy," Flexible Manufacturing Systems, Industrial Engineering and Management Press, Institute of Industrial Engineers, pp. 392-403, 1987.
  5. R. Akella, "An Algebraic Approach for the Decentralized Control of Large Linear Systems," Systems and Control Encyclopedia, Pergamon Press, Vol. 2, pp. 255-258, 1987. Invited Paper.
  6. R. Akella and P. R. Kumar, "Optimal Scheduling of a Flexible Manufacturing System: A Stochastic Control Problem for a System with Jump Markov Disturbances," Computational and Combinatorial Methods in Systems Theory,C.I. Byrnes and A. Lindquist (editors), Elsevier Science Publishers B.V.(North-Holland), pp. 367-379, 1986. 

Selected Invited Presentations

(out of more than 70 presentations including 35 INFORMS and 25 IEEE associated Conference Presentations)

  1. R. Akella, "Prediction Analytics in Services", CITRIS Services Conference, Imperial College, London, July 12-13, 2007.
  2. R. Akella, "Knowledge Services: Theory and Global Implementation", February 2007, IBM Almaden research.
  3. Zuobing Xu and R. Akella, "Optimal Stopping Policy for New Product Positioning", INFORMS, San Francisco, November 2005.
  4. R. Akella, "Knowledge Services for Business Process Management: Integrated Human- Information Systems", IBM Almaden Research, November 2005.
  5. R. Akella, "Squeezing $$$ from Data", Keynote Talk, CIO Forum, Zipf-Davis, September 2005.
  6. R.Akella, "Software value Chains: Indian and US Suppliers During the Downturn and Uptick", e-Business Research Center, Directors Conference, HP Palo Alto, March 2005.
  7. R. Akella, "IT Outsourcing", Invited Presentation, Design Con, Santa Clara, January 2005.
  8. R. Akella, "Enterprise Network Optimization", U C Berkeley European Logistics Workshop, October 2004
  9. R. Akella, "Information Systems and Cross Enterprise Learning in Support of New Product Introduction," University of Minnesota, MISRC, February 2004
  10. R. Akella, "Contracts, Options, and Portfolios in Supply Chain and Design Capacity Management Environments, " University of Minnesota, Information Systems department, February 2004
  11. R. Akella, (with Voit, Kishore, and Ramaswamy), "Triggered Learning Process from Production to Product Development," PICMT, July 2003
  12. R. Akella, "E- Business, SCM, and Options", Invited plenary talk at NSF Workshop on E-Commerce and SCM, Florida, February 2002
  13. R. Akella, (with K. Fridgeirsdottir, and A. Skumanich), "Yield Learning for Nanotechnologies" Invited Plenary Talk at SPIE, Santa Clara, March 2002
  14. R. Akella and R. Dossani, "Software Value Chains: The Indian Supplier Durin the Downturn", Invited Plenary Talk, ITCon/TIECon, Bangalore, November 2001
  15. R. Akella, "A Novel Integrated Approach to Yield Management and Learning", Invited Talk, ISMA 2000, Singapore.
  16. V. Araman, J. Kleinknecht, R. Akella, E. Tse, T. Costy, J. Tew, "Supplier and Procurement Risk Management in E-Business: Optimal Long term and Spot Market Mix," INFORMS, san Antonio, November, 2000
  17. R. Akella, "Frontiers in Product Life cycle Management," Invited Talk at I2 Planet 2000, Vienna, May 10-12, 2000
  18. V. Araman, J. Kleinknecht, and R. Akella, "Supply Chain Modeling and Spot Markets." INFORMS, Salt Lake City, Utah, May 7-10, 2000
  19. R. Akella, "Frontiers in Product Life Cycle Management," Invited talk, I2 Executive Forum,Sunnyvale, April 25, 2000
  20. C. Lin, and R. Akella, "Quality Management in semiconductor Yield Management," INFORMS, Salt Lake City, Utah, May 7-10, 2000
  21. Sematech Yield Council Presentation, "A Comparison of Global Process Learning in Semiconductor Plants and their economics," August 1998.
  22. R. Akella, INFORMS, Atlanta, November 1996: Five (co-authored) papers and two session chairmanships on Yield management and one paper on transfer pricing and supply contracts.
  23. R. Akella, "Yield Management, Learning, and Logistics," AMD, Austin, August 30, 1996. R. Akella, INFORMS, Washington D.C., My 1996: Two (co-authored) papers + one workshop (joint) on Yield Management.
  24. R. Akella, "Yield Management," Dept. of IEMS, Northwestern University, March 1995.
  25. R. Akella, "Yield and Enterprise Management," Dept. of ECE, University of California at San Diego, March 1995.
  26. R. Akella, "Logistics and Yield Management in Silicon Valley," Stanford University, Department of Engineering Economics, January 25, 1994.
  27. R. Akella, "Quality: Speed Trade-Offs, and Incentives," Stanford University, Business School Operations Management Seminar, January 27, 1993.
  28. R. Akella, "Logistics and Incentives," Stanford University, Department of Engineering Economic Systems, February 1993.
  29. R. Akella, "Uncertainty, Coordination, and Control in Cell, Plant, and Enterprise Systems," School of Engineering, University of California at Los Angeles, November 1992.
  30. R. Akella, "Logistics, Multi-plant coordination, and Enterprise Management," University of California at Berkeley, Department of Industrial Engineering and Operations Research, September 1992
  31. R. Akella, S. Bollapragada, "Enterprise Management: Integration Between Chained MRP Systems," Japan-USA Symposium on Flexible Automation, San Francisco, California, July 13 1992.
  32. R. Akella, "Flow Management and Incentives in Enterprise Management and Logistics," Operations Research Society, Genova, Italy, May 1992.
  33. R. Akella, "Coordination, Incentives, and Contracts in Enterprise Management and Logistics," Massachusetts Institute of Technology, Sloan School of Management, Operations Management Seminar Series, Cambridge, Massachusetts, February 1992.
  34. R. Akella , "Current Trends in Manufacturing Management, Confederation of Indian Industry, (Southern Region), Hyderabad, India, January 13 1992.
  35. R. Akella, "Hierarchical and Coordinated Control of Automated and Integrated Manufacturing," Joint U.S./German Conference on New Directions for Operations Research in Manufacturing sponsored by the Department of Commerce at the National Institute of Standards and Technology, Gaithersburg, Maryland, July 30-31 1991.
  36. R. Srinivasan, R. Akella, S. Bollapragada, S. Grotzinger. "Component Procurement and Planning Under Uncertainties in Multi-Plant Settings," ORSA/TIMS Joint National Meeting, Anaheim, California, November 3-6 1991.
  37. M.R.Singh, S.M. Datar, R. Akella, "Choice of Flexible Manufacturing Technology in a Dynamic Production Environment," ORSA/TIMS Joint National Meeting, Anaheim, California, November 3-6 1991.
  38. R. Akella, "Enterprise and Multi-Plant Coordination: Logistics, Quality, and Incentive Issues," MIT OM Summer Camp, June 24-27 1991.
  39. R. Anupindi, R. Akella, "Supply Management under Uncertainty," Multi-Echelon Inventory Conference, University of California at Berkeley, June 3-4 1991.